Highly Accelerated Thermal Shock (HATS™)
The Highly Accelerated Thermal Shock (HATS™) Test System
provides a time-efficient and cost-effective air-to-air reliability test
method based on traditional air-to-air thermal cycling.
The system uses a single chamber in which high volume hot and cold
air alternately pass stationary samples, providing rapid thermal
transfer, and reducing the time for the samples to reach temperature
equilibrium.
The samples are fixtured to a high-speed precision resistance sampling
network, allowing continous monitoring of the samples during the
temperature cycles.
HATS™ Test System
- Air-to-air methodology
- Single chamber with stationary coupons
- High volume airflow with large heat transfer capacity
- 36 coupons (144 nets) per chamber load
- Temperature cycles from -60°C to +160°C
- Software optimized cycle times
- Easy coupon design
Contact Us for More Details
Tech Circuits, Inc.
340 Quinnipiac Street
P.O. Box 309
Wallingford, CT 06492
Phone: (203) 269-3311
Fax: (203) 284-9389
Email Tech Circuits Sales
sales@techcircuits.com
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